Data Converter (ADC/DAC) test system solutions cover INL, DNL, SNR, THD, IDD, IDDQ and voltage high/low criticality tests. The semiconductor test platform allows engineers to build efficient semiconductor test systems. These systems can reduce development time and equipment size to meet increasingly complex test requirements.

Data Converter (ADC/DAC) test system solutions cover INL, DNL, SNR, THD, IDD, IDDQ and voltage high/low criticality tests. The semiconductor test platform allows engineers to build efficient semiconductor test systems. These systems can reduce development time and equipment size to meet increasingly complex test requirements.